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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Developments in X-Ray Tomography VIII - Calibration of a combined laboratory microCT/microXRF system

✍ Scribed by Liu, Xuan; Stock, Stuart R.; Bruyndonckx, Peter; Sasov, Alexander

No coin nor oath required. For personal study only.

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