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SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 2 March 2003)] Testing, Reliability, and Application of Micro- and Nano-Material Systems - Processing and electrical characterization in intrinsic conducting polymers for electronic and MEMS applications

โœ Scribed by Seifert, Wilhelm; Albrecht, Henrik; Mietke, Stephan; Koehler, Thomas; Werner, Matthias; Meyendorf, Norbert; Baaklini, George Y.; Michel, Bernd

Book ID
121662297
Publisher
SPIE
Year
2003
Weight
127 KB
Volume
5045
Category
Article

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