SPIE Proceedings [SPIE NDE For Health Monitoring and Diagnostics - San Diego, CA (Sunday 17 March 2002)] Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems - Accelerated life testing (ALT) in microelectronics and photonics: its role, attributes, challenges, pitfalls, and interaction with qualification tests

✍ Scribed by Suhir, Ephraim; Meyendorf, Norbert; Baaklini, George Y.; Michel, Bernd

• Book ID: 121363479
• Publisher: SPIE
• Year: 2002
• Weight: 132 KB
• Volume: 4703
• Category: Article
• DOI: 10.1117/12.469620