SPIE Proceedings [SPIE Microelectronics, MEMS, and Nanotechnology - Canberra, ACT, Australia (Wednesday 5 December 2007)] Microelectronics: Design, Technology, and Packaging III - A new total static leakage estimation model for UDSM-based transistor stacks

✍ Scribed by Al-Hertani, Hussam; Al-Khalili, Dhamin; Rozon, Côme; Hariz, Alex J.; Varadan, Vijay K.

• Book ID: 115518709
• Publisher: SPIE
• Year: 2007
• Weight: 381 KB
• Volume: 6798
• Category: Article
• DOI: 10.1117/12.758952