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SPIE Proceedings [SPIE Microelectronics, MEMS, and Nanotechnology - Canberra, ACT, Australia (Wednesday 5 December 2007)] Photonics: Design, Technology, and Packaging III - Characterization of fs-laser written refractive index changes using near-field scanning optical microscopy

✍ Scribed by Little, D.; Dekker, P.; Rahmani, A.; Dawes, J.; Marshall, G.; Withford, M.; Krolikowski, Wieslaw Z.; Soukoulis, Costas M.; Lam, Ping Koy; Davis, Timothy J.; Fan, Shanhui; Kivshar, Yuri S.

Book ID: 120976405
Publisher: SPIE
Year: 2007
Weight: 909 KB
Volume: 6801
Category: Article
DOI: 10.1117/12.761087

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