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SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering - Applications of Fresnel diffraction from phase objects

✍ Scribed by Tavassoly, Mohammad T.; Darudi, Ahmad; Khalesifard, Hamid R.; Sadat Hosseini, Seyed M. R.; Hoefling, Roland; Jueptner, Werner P. O.; Kujawinska, Malgorzata

Book ID: 121300410
Publisher: SPIE
Year: 2001
Weight: 427 KB
Volume: 4399
Category: Article
DOI: 10.1117/12.445579

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