✦ LIBER ✦

SPIE Proceedings [SPIE Lasers and Optics in Manufacturing III - Munich, Germany (Monday 16 June 1997)] Optical Inspection and Micromeasurements II - Particle size and position measurement with digital holography

✍ Scribed by Adams, Mike; Kreis, Thomas M.; Jueptner, Werner P. O.; Gorecki, Christophe

No coin nor oath required. For personal study only.

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