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SPIE Proceedings [SPIE Lasers and Optics in Manufacturing III - Munich, Germany (Monday 16 June 1997)] Optical Inspection and Micromeasurements II - Measurement of the absorption of nonlinear crystals used for high-average-power frequency doubling

✍ Scribed by Mann, Guido; Seidel, Stefan; Gorecki, Christophe

No coin nor oath required. For personal study only.

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