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SPIE Proceedings [SPIE International Symposium on Precision Engineering Measurement and Instrumentation 2012 - Chengdu, China (Wednesday 8 August 2012)] Eighth International Symposium on Precision Engineering Measurement and Instrumentation - Filtering method for phase fringe patterns in the digital speckle pattern interferometry

✍ Scribed by Wang, Yonghong; Bu, Weihua; Li, Junrui; Sun, Jianfei; Yang, Lianxiang; Lin, Jie

Book ID: 121449494
Publisher: SPIE
Year: 2013
Weight: 816 KB
Volume: 8759
Category: Article
DOI: 10.1117/12.2014792

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