SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Optical properties of liquid metals studied by spectroscopic ellipsometry

✍ Scribed by Krishnan, Shankar; Yugawa, Koji J.; Nordine, Paul C.; Yoshizawa, Toru; Yokota, Hideshi

• Book ID: 120933375
• Publisher: SPIE
• Year: 1996
• Weight: 48 KB
• Volume: 2873
• Category: Article
• DOI: 10.1117/12.246250