SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Birefringence induced by residual strain in optically isotropic III-V compound crystals

✍ Scribed by Fukuzawa, Masayuki; Yamada, Masayoshi; Yoshizawa, Toru; Yokota, Hideshi

• Book ID: 120534237
• Publisher: SPIE
• Year: 1996
• Weight: 286 KB
• Volume: 2873
• Category: Article
• DOI: 10.1117/12.246233