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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrolo - Accelerated aging test on LEDs life estimation

✍ Scribed by Dong, Yi; Zhang, Shu-sheng; Du, Jiang-qi; Weber, Larry; Kwok, Hoi S.; Hou, Yanbing; Yang, Lianxiang; Yu, Chongxiu; Fang, Fengzhou; Weckenmann, Albert; Zhao, Ji; Zeppenfeld, Peter; Luo, Jack

Book ID: 121378333
Publisher: SPIE
Year: 2011
Weight: 429 KB
Volume: 8202
Category: Article
DOI: 10.1117/12.906118

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