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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology - Weak point target detection in the complicated infrared background

✍ Scribed by Hong, Pu; Wang, Chensheng; Zhang, Zhijie

Book ID: 120456369
Publisher: SPIE
Year: 2011
Weight: 280 KB
Volume: 8200
Category: Article
DOI: 10.1117/12.904671

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Automatic peak detection is important for the application of Raman spectroscopy. However, the existence of noise and baseline disturbances will greatly degrade the reliability and accuracy of the peak detection. In this paper we proposed a hybrid wavelet-transform-based algorithm to improve the peak