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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications - The micro-strain measurement research of a double-microscopic of digital speckle correlation measurement

✍ Scribed by Ma, Kun; Wu, Jiaquan; Chen, Xiaoyu; Xia, Li; Tang, Sui; Li, Xunpeng; Ye, Shenghua; Zhang, Guangjun; Ni, Jun

Book ID: 120497409
Publisher: SPIE
Year: 2008
Weight: 433 KB
Volume: 7160
Category: Article
DOI: 10.1117/12.820718

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