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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications - The effects of APS star tracker detection sensitivity

✍ Scribed by Zhang, Huaxun; Li, Jie; Ye, Shenghua; Zhang, Guangjun; Ni, Jun

Book ID: 120206723
Publisher: SPIE
Year: 2008
Weight: 274 KB
Volume: 7160
Category: Article
DOI: 10.1117/12.805547

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