SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2007 - San Jose, CA (Saturday 20 January 2007)] Light-Emitting Diodes: Research, Manufacturing, and Applications XI - Measurement of the internal quantum efficiency of InGaN quantum wells

✍ Scribed by Laubsch, A.; Sabathil, M.; Bruederl, G.; Wagner, J.; Strassburg, M.; Baur, E.; Braun, H.; Schwarz, U. T.; Lell, A.; Lutgen, S.; Linder, N.; Oberschmid, R.; Hahn, B.; Streubel, Klaus P.; Jeon, Heonsu

• Book ID: 121385809
• Publisher: SPIE
• Year: 2007
• Weight: 320 KB
• Volume: 6486
• Category: Article
• DOI: 10.1117/12.700829