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SPIE Proceedings [SPIE AeroSense 2003 - Orlando, FL (Monday 21 April 2003)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII - Basic development and testing of a short-range laser profiling model

✍ Scribed by Sabol, Bruce M.; Ballard, Jr., Jerrell R.; Murrer, Jr., Robert Lee

No coin nor oath required. For personal study only.

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