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SPIE Proceedings [SPIE Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies - Constanta, Romania (Thursday 26 August 2010)] Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V - Preliminary ellipsometric studies and tests for measuring the birefringence of electro-optic materials

✍ Scribed by Logofătu, Petre Cătălin; Udrea, Cristian; Ion, Valentin; Scărişoreanu, Nicu Doinel; Műller, Raluca; Schiopu, Paul; Caruntu, George

Book ID: 111985595
Publisher: SPIE
Year: 2010
Weight: 438 KB
Volume: 7821
Category: Article
DOI: 10.1117/12.882140

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