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SPIE Proceedings [SPIE Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV - Constanta, Romania (Thursday 28 August 2008)] Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV - Atomic absorption spectrophotometry for the analysis of metal contents in tobacco samples

✍ Scribed by Iancu, O.; Schiopu, P.; Cristea, I.; Voinea, V.; Grosu, N.; Craciun, A.; Schiopu, Paul; Panait, Cornel; Caruntu, George; Manea, Adrian

Book ID: 111694120
Publisher: SPIE
Year: 2009
Weight: 232 KB
Volume: 7297
Category: Article
DOI: 10.1117/12.823630

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