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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Correction of full spatial frequency errors with ion beam figuring

✍ Scribed by Gu, Yong-qiang; Yang, Li; Ruch, Eric; Li, Shengyi

Book ID: 120290382
Publisher: SPIE
Year: 2012
Weight: 521 KB
Volume: 8416
Category: Article
DOI: 10.1117/12.977840

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