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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Ultra-precision surface polishing using ion beam figuring

✍ Scribed by Ghim, Young-Sik; You, Shin-Jae; Rhee, Hyug-Gyo; Yang, Ho-Soon; Lee, Yun-Woo; Yang, Li; Ruch, Eric; Li, Shengyi

Book ID: 120230721
Publisher: SPIE
Year: 2012
Weight: 487 KB
Volume: 8416
Category: Article
DOI: 10.1117/12.973725

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