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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems - Subwavelength patterning based on a surface plasmon resonant cavity

✍ Scribed by Chen, Genhua; Wang, Chinhua; Xiao, Wei; Xu, Fuyang; Lou, Yiming; Cao, Bing; Zhang, Guiju; Ye, Tianchun; Hu, Song; Li, Yanqiu; Luo, Xiangang; Bao, Xiaoyi

Book ID: 120183036
Publisher: SPIE
Year: 2012
Weight: 655 KB
Volume: 8418
Category: Article
DOI: 10.1117/12.975807

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