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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems - Optical components damage parameters database system

✍ Scribed by Tao, Yizheng; Li, Xinglan; Jin, Yuquan; Xie, Dongmei; Tang, Dingyong; Ye, Tianchun; Hu, Song; Li, Yanqiu; Luo, Xiangang; Bao, Xiaoyi

Book ID: 120183037
Publisher: SPIE
Year: 2012
Weight: 295 KB
Volume: 8418
Category: Article
DOI: 10.1117/12.975963

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