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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - The accurate measurement of background carrier concentration in short-period longwave InAs/GaSb superlattices on GaSb substrate

✍ Scribed by Xu, Zhicheng; Chen, Jianxin; Xu, Qingqing; Zhou, Yi; Jin, Chuan; Wang, Fangfang; He, Li; Jiang, Yadong; Yu, Junsheng; Wang, Zhifeng

Book ID: 118179675
Publisher: SPIE
Year: 2012
Weight: 418 KB
Volume: 8419
Category: Article
DOI: 10.1117/12.970554

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