SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Up-converion in bismuth doped fibers

✍ Scribed by Qiu, Yanqing; Wang, Jianfeng; Jin, Yongxing; Jiang, Ya-Dong; Kippelen, Bernard; Yu, Junsheng

• Book ID: 111889044
• Publisher: SPIE
• Year: 2010
• Weight: 241 KB
• Volume: 7658
• Category: Article
• DOI: 10.1117/12.865169