SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Threat assessment of aerial target in ultra-wide field of view infrared image

✍ Scribed by Zhou, Yulong; Xing, Mingqiang; Wang, Yongzhong; Jiang, Ya-Dong; Kippelen, Bernard; Yu, Junsheng

• Book ID: 111674486
• Publisher: SPIE
• Year: 2010
• Weight: 231 KB
• Volume: 7658
• Category: Article
• DOI: 10.1117/12.865786