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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Photoluminescence investigation of InAs quantum dots in quantum well with different strain reducing layer

✍ Scribed by Kong, Lingmin; Zhou, Yunqing; Wang, Rui; Zhang, Cunxi; Yao, Jianming; Wang, Shilai; Cai, Jiafa; Wu, Zhengyun; Jiang, Ya-Dong; Kippelen, Bernard; Yu, Junsheng

Book ID: 121310747
Publisher: SPIE
Year: 2010
Weight: 236 KB
Volume: 7658
Category: Article
DOI: 10.1117/12.864046

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