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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Systematical investigations of annealing effects on electrical properties and thermal sensitivity characteristics of TiO2-δ thin films by DC reactive magnetron sputtering

✍ Scribed by Qiu, Yonglong; Wu, Zhiming; Ju, Yongfeng; Jiang, Jing; Luo, Zhenfei; Du, MingJun; Jiang, Ya-Dong; Kippelen, Bernard; Yu, Junsheng


Book ID
120459622
Publisher
SPIE
Year
2010
Weight
292 KB
Volume
7658
Category
Article

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