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SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Super-resolved imaging system with oversampling technology

✍ Scribed by Zhang, Xin; Liu, Yanyan; Zhang, Jian-ping; Wang, Ling-jie; Yang, Li; Chen, Yaolong; Kley, Ernst-Bernhard; Li, Rongbin

Book ID: 120285368
Publisher: SPIE
Year: 2007
Weight: 281 KB
Volume: 6722
Category: Article
DOI: 10.1117/12.782950

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