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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - New method for studying the relationship between morphological parameters and cell viability

✍ Scribed by Xiong, Jianwen; Dai, Weiping; Chen, Li; Liu, Guixiang; Liu, Mingsheng; Zhang, Zhenxi; Xiao, Hua; Hou, Xun; Yuan, Jiahu; Wyant, James C.; Wang, Hexin; Han, Sen

Book ID: 121488520
Publisher: SPIE
Year: 2006
Weight: 273 KB
Volume: 6150
Category: Article
DOI: 10.1117/12.676524

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