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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Analysis for the characteristic of a four-quadrant photo-detector applied to a novel laser aligning system

✍ Scribed by Wang, Xiuqing; Xu, De; Tan, Min; Liu, Yun; Hou, Xun; Yuan, Jiahu; Wyant, James C.; Wang, Hexin; Han, Sen

Book ID: 120972977
Publisher: SPIE
Year: 2006
Weight: 345 KB
Volume: 6150
Category: Article
DOI: 10.1117/12.676740

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