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SPIE Proceedings [SPIE 1988 Semiconductor Symposium - Newport Beach, CA (Monday 14 March 1988)] Spectroscopic Characterization Techniques for Semiconductor Technology III - Photoreflectance And The Seraphin Coefficients In Quantum Well Structures

✍ Scribed by Zheng, X. L.; Helman, D.; Lax, B.; Chambers, F. A.; Glembocki, Orest J.; Pollak, Fred H.; Ponce, Fernando A.

No coin nor oath required. For personal study only.

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