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Spectroscopic studies of TM/Si and TM/SiO2 interfaces

✍ Scribed by I. Jarrige; P. Jonnard; P. Holliger; T.P. Nguyen


Book ID
108418011
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
102 KB
Volume
212-213
Category
Article
ISSN
0169-4332

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