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Spectroscopic ellipsometry study on TiO2 thin films modified by N2–H2 plasma surface treatment

✍ Scribed by S. Tanemura; L. Miao; H. Watanabe; Y. Mori

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 137 KB
Volume: 244
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2004.10.116

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