Ag 2 O film was prepared on glass substrate by direct current reactive magnetron sputtering under a careful control of the preparation parameters. The analysis of the dielectric constants of the Ag 2 O film related to the optical properties was conducted by spectroscopic ellipsometry (SE) and single
✦ LIBER ✦
Spectroscopic ellipsometry study of the dielectric response of Au–In and Ag–Sn thin-film couples
✍ Scribed by A.A. Wronkowska; A. Wronkowski; K. Kukliński; M. Senski; Ł. Skowroński
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 414 KB
- Volume
- 256
- Category
- Article
- ISSN
- 0169-4332
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