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Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared

✍ Scribed by V. Tkachenko; A. Marino; F. Vita; F. D’Amore; L. De Stefano; M. Malinconico; M. Rippa; G. Abbate

Book ID
111631933
Publisher
Springer-Verlag
Year
2004
Tongue
English
Weight
316 KB
Volume
14
Category
Article
ISSN
1292-8941

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The major optical technique applied in this paper is spectroscopic ellipsometry. Ellipsometry measures the polarization change of the light due to interaction with the sample surface. It is called 'spectroscopic' if the measurement is performed at various wavelengths within a spectral interval. Spec