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Spectroscopic ellipsometry studies of amorphous PZT thin films with various Zr/Ti stoichiometries

✍ Scribed by Shenghong Yang; Dang Mo; Xinggui Tang


Book ID
110390241
Publisher
Springer
Year
2002
Tongue
English
Weight
105 KB
Volume
37
Category
Article
ISSN
0022-2461

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Optical properties of Pb(Zr0.53Ti0.47)O3
✍ Y.P. Jiang; X.G. Tang; Q.X. Liu; Q. Li; A.L. Ding πŸ“‚ Article πŸ“… 2007 πŸ› Elsevier Science 🌐 English βš– 740 KB

Pb(Zr 0.53 Ti 0.47 )O 3 (PZT) thin films grown on Pt-coated Si substrates were prepared by a sol-gel process. Crystalline structure characterisation and optical constants (refractive index n, extinction coefficient k) and bandgaps E g of PZT thin films annealed at 550, 600 and 650 β€’ C were obtained