Determination of Complex Optical Constan
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En Naciri, A. ;Johann, L. ;Kleim, R. ;Sieskind, M. ;Amann, M.
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Article
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1999
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John Wiley and Sons
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English
โ 233 KB
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The conventional ellipsometry can be applied to determine the optical properties of anisotropic materials only if the measurements are made for in-plane uniaxial anisotropy of the bulk sample with the optic axis parallel or perpendicular to the plane of incidence. For arbitrarily oriented anisotropi