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Spectroscopic ellipsometry of anisotropic materials: application to the optical constants of HgI_2

โœ Scribed by En Naciri, Aotmane ;Johann, Luc ;Kleim, Roland ;Sieskind, Manuel ;Amann, Marianne


Book ID
115347794
Publisher
The Optical Society
Year
1999
Tongue
English
Weight
164 KB
Volume
38
Category
Article
ISSN
1559-128X

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โœ En Naciri, A. ;Johann, L. ;Kleim, R. ;Sieskind, M. ;Amann, M. ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 233 KB ๐Ÿ‘ 2 views

The conventional ellipsometry can be applied to determine the optical properties of anisotropic materials only if the measurements are made for in-plane uniaxial anisotropy of the bulk sample with the optic axis parallel or perpendicular to the plane of incidence. For arbitrarily oriented anisotropi