<p><p>Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique fea
Spectroscopic Ellipsometry for Photovoltaics: Volume 1: Fundamental Principles and Solar Cell Characterization
โ Scribed by Hiroyuki Fujiwara, Robert W. Collins
- Publisher
- Springer International Publishing
- Year
- 2018
- Tongue
- English
- Leaves
- 602
- Series
- Springer Series in Optical Sciences 212
- Edition
- 1st ed.
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Synopsis
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.
The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
โฆ Table of Contents
Front Matter ....Pages i-xx
Introduction (Hiroyuki Fujiwara)....Pages 1-16
Front Matter ....Pages 17-17
Measurement Technique of Ellipsometry (Robert W. Collins)....Pages 19-58
Data Analysis (James N. Hilfiker, Jianing Sun, Nina Hong)....Pages 59-88
Optical Properties of Semiconductors (Maria Isabel Alonso, Miquel Garriga)....Pages 89-113
Dielectric Function Modeling (James N. Hilfiker, Tom Tiwald)....Pages 115-153
Effect of Roughness on Ellipsometry Analysis (Hiroyuki Fujiwara)....Pages 155-172
Front Matter ....Pages 173-173
Ex Situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon (Zhiquan Huang, Lila R. Dahal, Prakash Koirala, Wenhui Du, Simon Cao, Xunming Deng et al.)....Pages 175-200
Crystalline Silicon Solar Cells (Gerald E. Jellison Jr., Pooran C. Joshi)....Pages 201-225
Amorphous/Crystalline Si Heterojunction Solar Cells (Hiroyuki Fujiwara)....Pages 227-252
Optical Properties of Cu(In,Ga)Se2 (Hiroyuki Fujiwara)....Pages 253-280
Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1โxGaxSe2 for Complex Dielectric Function Determination and Parameterization (Abdel-Rahman A. Ibdah, Puruswottam Aryal, Puja Pradhan, Sylvain Marsillac, Nikolas J. Podraza, Robert W. Collins)....Pages 281-331
Cu2ZnSn(S,Se)4 and Related Materials (Sukgeun Choi)....Pages 333-355
Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics (Prakash Koirala, Jian Li, Nikolas J. Podraza, Robert W. Collins)....Pages 357-413
High Efficiency IIIโV Solar Cells (Nikolas J. Podraza)....Pages 415-438
Organic Solar Cells (Maria Isabel Alonso, Mariano Campoy-Quiles)....Pages 439-461
Organic-Inorganic Hybrid Perovskite Solar Cells (Hiroyuki Fujiwara, Nikolas J. Podraza, Maria Isabel Alonso, Masato Kato, Kiran Ghimire, Tetsuhiko Miyadera et al.)....Pages 463-507
Solar Cells with Photonic and Plasmonic Structures (Peter Petrik)....Pages 509-522
Transparent Conductive Oxide Materials (Hiroyuki Fujiwara, Shohei Fujimoto)....Pages 523-563
High-Mobility Transparent Conductive Oxide Layers (Takashi Koida)....Pages 565-586
Back Matter ....Pages 587-594
โฆ Subjects
Physics; Optics, Lasers, Photonics, Optical Devices; Optical and Electronic Materials; Microwaves, RF and Optical Engineering; Renewable and Green Energy
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