A User's Guide to Ellipsometry
โ Harland G. Tompkins (Auth.)
๐ Library
๐
1993
๐ Academic Press
๐ English
โฆ LIBER โฆ
๐
Spectroscopic Ellipsometry and Reflectometry: A User's Guide
โ Scribed by Tompkins, McGahan
- Publisher
- John Wiley & Sons
- Year
- 1999
- Tongue
- English
- Leaves
- 237
- Edition
- 1
- Category
- Library
โฌ Acquire This Volume
No coin nor oath required. For personal study only.
โฆ Synopsis
While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.
๐ SIMILAR VOLUMES
โ Tompkins, Harland G
๐ Library
๐
1993
๐ Boston : Academic Press
๐ English
xv, 260 p. : 24 cm
Spectroscopic Ellipsometry: Principles a
โ Hiroyuki Fujiwara
๐ Library
๐
2007
๐ Wiley
๐ English
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data
Spectroscopic Ellipsometry: Principles a
โ Hiroyuki Fujiwara
๐ Library
๐
2007
๐ English
Spectroscopic ellipsometry : principles
โ Hiroyuki Fujiwara
๐ Library
๐
2007
๐ John Wiley & Sons
๐ English
Bridging the gap between laser physics and applied mathematics, this book offers a new perspective on laser dynamics. Combining fresh treatments of classic problems with up-to-date research, asymptotic techniques appropriate for nonlinear dynamical systems are shown to offer a powerful alternative t
Spectroscopic Ellipsometry: Principles a
โ Fujiwara H.
๐ Library
๐
2007
๐ English
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data