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Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films

✍ Scribed by N.V Edwards; S.D Yoo; M.D Bremser; M.N Horton; N.R Perkins; T.W Weeks Jr.; H Liu; R.A Stall; T.F Kuech; R.F Davis; D.E Aspnes

Book ID: 114086307
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 178 KB
Volume: 313-314
Category: Article
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(97)00815-8

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