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Spectroscopic ellipsometry analysis of GaAs1 − xNx layers grown by molecular beam epitaxy

✍ Scribed by N. Ben Sedrine; J. Rihani; J.L. Stehle; J.C. Harmand; R. Chtourou

Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
411 KB
Volume
28
Category
Article
ISSN
0928-4931

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