Spectroscopic ellipsometric characterization of transparent thin film amorphous electronic materials: integrated analysis

✍ Scribed by K.V. Popov; A.V. Tikhonravov; J. Campmany; E. Bertran; S. Bosch; A. Canillas

• Book ID: 114086341
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 143 KB
• Volume: 313-314
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/s0040-6090(97)00850-x