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Spectroscopic Analysis of the Interface Between Si and Its Thermally Grown Oxide

✍ Scribed by Aspnes, D. E.

Book ID: 123614048
Publisher: The Electrochemical Society
Year: 1980
Tongue: English
Weight: 952 KB
Volume: 127
Category: Article
ISSN: 0013-4651
DOI: 10.1149/1.2129899

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