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Specific features of depth distribution profiles of implanted cobalt ions in rutile TiO2

✍ Scribed by A. A. Achkeev; R. I. Khaibullin; L. R. Tagirov; A. Mackova; V. Hnatowicz; N. Cherkashin

No coin nor oath required. For personal study only.

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Anomalous depth profile of implanted flu

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Depth distribution and stability of impl

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