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Spatially resolved Raman piezo-spectroscopic stress analysis in CaMoO4thin film grown on Si substrate

✍ Scribed by Li, Runtao ;Zhu, Wenliang ;Ge, Wanyin ;Pezzotti, Giuseppe

Publisher
John Wiley and Sons
Year
2009
Tongue
English
Weight
656 KB
Volume
206
Category
Article
ISSN
0031-8965

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