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Spatial resolution of a microwave cavity method of measuring the specific resistivity of semiconductors

โœ Scribed by M. V. Detinko; Yu. V. Medvedev; A. S. Petrov


Book ID
112427140
Publisher
Springer
Year
1982
Tongue
English
Weight
396 KB
Volume
25
Category
Article
ISSN
1573-9228

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