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Spatial distribution of defects in high‐purity silica glasses

✍ Scribed by Tohmon, Ryoichi; Ikeda, Akihiro; Shimogaichi, Yasushi; Munekuni, Shuji; Ohki, Yoshimichi; Nagasawa, Kaya; Hama, Yoshimasa

No coin nor oath required. For personal study only.

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