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Spatial distortions in solid-state semiconductor X-ray imaging detectors

โœ Scribed by M.G. Fedotov; E.A. Kuper; V.E. Panchenko; S.A. Tiunov


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
218 KB
Volume
308
Category
Article
ISSN
0168-9002

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๐Ÿ“œ SIMILAR VOLUMES


Characterization of spatial homogeneity
โœ P.N. Aruev; Yu.M. Kolokolnikov; N.V. Kovalenko; A.A. Legkodymov; V.V. Lyakh; A.D ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 379 KB

We at Siberian Synchrotron Radiation Center (Novosibirsk) have conducted comparative studies of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors SPD-100UV developed by the Physical Technical Institute (St. Petersburg) as well as AXUV-100 (made by IRD Inc., USA).