๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Sources of measurement error of fast-flowing process parameters by charge-coupled devices

โœ Scribed by V. A. Arutyunov; V. G. Mel'nikov; S. M. Slobodyan; D. P. Chaporov; O. N. Popov


Publisher
Springer US
Year
1983
Tongue
English
Weight
332 KB
Volume
26
Category
Article
ISSN
0543-1972

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Measurement of thresholds of damage to a
โœ Jian Lu; Xaio-Wu Ni; Zhen-Hua Lin; An-Zhi He ๐Ÿ“‚ Article ๐Ÿ“… 1996 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 352 KB

The interaction process of laser and MOS-type charge-coupled devices (CCD) has been analyzed in brief: Several kinds of damage thresholds, including optical breakdown threshold, direct damage threshold, and laser energy threshold (which lea& to compkte failure of the device) produced by a Q-m'tched